Our current research interests are in the following areas: (I) application of (1) atomic force microscopy (AFM), (2) Fourier transform infrared microscopy (FTIRM), and (3) attenuated total reflectance microscopy (ATRM) to Forensic Science problems. (II) Growth and characterization of nanoparticle quantum dots, and (III) ion/atom/electron surface dynamics using experimental coincidence-correlation techniques and theoretical analysis.