Advanced Ion Beam Surface and ultra-thin films Analysis: RBS, MEIS, NRA, PIXE, Channeling, Recoil Spectrometry, Ion microprobe Analysis, Ion Beam Induced Charge Collection and Ion-solid interactions.
Ion Beam Modification and Irradiation effects
Surface Characterization: X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES).
Oxides and composites for Advanced Electronic Materials
Metallization of Semiconductors and Diffusion Barriers
Hydrogen and Impurity Defects related Phenomena in Electronic structures
Interfacial stability in Electronic and Opto-electronic structures: Atomic Exchange, Diffusion, Reaction and Properties inter-correlations.