Gas storage and purification, Carbon based nanostructured materials, Systems for PcT adsorption/desorption isotherm acquisition and analysis, AFM (Atomic Force Microscopy);STM (Scanning Tunneling Microscopy);Surface electron spectroscopies (High Resolution/Electron Energy Loss Spectroscopy:HREELS / EELS; Auger spectroscopy);Raman spectroscopy;Photoemission Spectroscopies (XPS and UPS), Vacuum technology (UHV);X-ray Diffraction (XRD);Brauner-Emmett-Teller surface area analysis (BET);Differential thermal analysis (DTA);Thermal gravimetric analysis (TGA);SEM (Scanning Electron Microscopy) with EDX (microanalysis)